Kepler is a fully automated high speed SSD functional test handler. High speed insertion and removal to DUT is achieved through RPT and batch insertion technology developed by Getech. Single SSD insertion and removal is available for exception process flows. After testing, the SSDs are binned to dynamically configured bin trays. Kepler can integrate Advantest and Neosem testers. The test module is flexible and expandable based on testing time. Minimum configuration is optimized for 0.7hours test time and close to 100% tester utilization. Throughput of machine is 550UPH. Kepler can be converted to handle all industry SSD form factors. Kepler interface to testers through SECS/GEM Semicon industry standard protocols and processes. Kepler comply with GEM300 processes.